Transmission Electron Microscope (TEM)

Advanced Cryo-Electron Microscopes for High-Resolution Biological Imaging

Built to meet the growing demands of structural biology and drug discovery, our Cryo TEM lineup—featuring the CRYO ARM™ 300 II, CRYO ARM™ 300, and CRYO ARM™ 200 II—delivers superior imaging performance with unmatched ease of use. These systems enable atomic-level visualization of proteins, cells, and biomolecules without staining or crystallization, preserving native structures through ultra-low temperature observation.

Equipped with cold field emission guns (Cold FEG), in-column Omega energy filters, and automated specimen exchange systems (up to 12 samples), these all-in-one microscopes offer reliable, high-throughput operation. From screening to data acquisition, researchers benefit from user-friendly software, minimal beam damage, and consistently high contrast and resolution—even for new users.

Key Features

• Cold Field Emission Gun (Cold FEG) for high-brightness, low energy-spread electron beams
• In-column Omega energy filter for zero-loss imaging and enhanced contrast
• Hole-free phase plate for clear visualization of low-contrast biological specimens
• Fully automated sample exchange system with 12-grid storage
• Automated functions: autofocus, beam alignment, and parallel-beam illumination
• High-precision, rotation-free sample stage for accurate positioning and reproducibility
• Advanced beam shift + stage movement for faster data acquisition
• Contamination-free grid handling in nitrogen-cooled environment
• Integrated image acquisition software for single particle analysis

Ideal For / Application Areas

• Structural biology and proteomics
• Cryo-EM-based drug discovery
• Academic and clinical research laboratories

• Molecular and cellular imaging
• High-throughput Single Particle Analysis
• MicroED and Cryo Tomography
• Research institutes working with membrane proteins, viruses, or macromolecules

High-Throughput, Automated Nanoscale Analysis

Built for modern semiconductor labs, the JEM-ACE200F offers high-throughput, automated transmission electron microscopy with minimal manual input. It features cold FEG, optional Cs corrector, and a fast, high-sensitivity stage—ideal for detailed imaging and analysis.

With recipe-based operation, automatic tuning, and seamless data acquisition (TEM, STEM, EDS), it simplifies complex workflows. Remote operation, magnification calibration, and integration with CD measurement software make it a powerful tool for semiconductor R&D, inspection, and metrology.

Key Features – TEM for Semiconductors (JEM-ACE200F)

• High-throughput analytical electron microscope with Cold-FEG source
• Inherits core technologies from JEM-ARM200F & JEM-F200 platforms
• Optional Cs corrector for enhanced resolution
• Fast, high-sensitivity motorized stage with fine piezo-like control
• Intuitive interface with recipe-based automation for easy operation
• Automated tuning: autofocus, beam centering, specimen height, etc.
• Integration with Gatan camera and CD measurement tools
• Multi-specimen data acquisition across TEM, STEM & EDS modes
• Remote operation & multi-location collaboration support
• Noise- and temperature-resistant column enclosure design

Ideal For

• Semiconductor R&D and process development
• Critical dimension (CD) metrology and failure analysis
• Automated imaging and mapping of device structures
• Multi-site labs needing centralized data collection and review
• Quality control and defect inspection in semiconductor manufacturing

Precision Imaging in Magnetic Field-Free Environments

The JEM-Z200MF is a specialized Transmission Electron Microscope designed for observing magnetic materials without interference from magnetic fields. Its field-free objective lens architecture and advanced double aberration correction make it ideal for high-resolution and high-stability imaging at the atomic level. This system is perfectly suited for research in magnetic materials, soft matter, and precision nanostructures where magnetic disturbance must be minimized.

Key Features

• Magnetic Field-Free Objective Lens: Dual-lens design (FOL/BOL) cancels magnetic fields at the sample plane, enabling clean, distortion-free observation.
• Atomic Resolution with Double Corrector: Correctors on both illumination and imaging sides support ultra-high resolution in STEM and TEM modes.
• Dual STEM Modes:
  • Large Convergence Angle Mode (20 mrad): For high-resolution imaging.
  • Small Convergence Angle Mode (1.0 mrad): For high-sensitivity DPC STEM observations.
• Smart Imaging Switch: Instantly toggle between conventional and high-resolution modes with one-button control.
• 200 kV Operation: Delivers high performance for advanced material characterization.

Ideal For

• Magnetic materials and nanostructure research
• Low-disturbance soft material imaging
• High-resolution STEM/TEM applications
• DPC (Differential Phase Contrast) studies
• Atomic-scale material development

Ultrahigh-Resolution Atomic-Level Imaging with Advanced Analytical Capabilities

The 300kV TEM, led by the JEM-ARM300F2 GRAND ARM™2, is engineered for cutting-edge materials research and atomic-resolution analysis. Featuring JEOL’s most advanced technology, this system delivers unmatched imaging clarity, exceptional analytical sensitivity, and long-term stability. It supports a wide voltage range and is ideal for demanding applications such as nanomaterials, semiconductors, and atomic-level structural analysis.

Key Features

• Ultrahigh spatial resolution with sub-angstrom EDS elemental mapping
• FHP2 objective lens for improved X-ray detection and imaging performance
• Box-type column enclosure for minimized environmental interference
• Quick aberration correction using JEOL COSMO™ and ETA corrector
• Next-gen CFEG with compact SIP for enhanced vacuum and vibration resistance
• Improved emission & probe current stability for long-duration analysis

Ideal For

• Advanced nanomaterials & atomic-scale research
• Semiconductor device characterization
• Crystallographic and elemental analysis
• R&D requiring extreme resolution and analytical precision
• Institutions and labs working at the frontiers of electron microscopy

Advanced Performance for Atomic-Scale Imaging and Analysis

Our 200kV TEM systems deliver exceptional imaging resolution, analytical capabilities, and operational versatility to meet the demands of both advanced research and routine analysis. With field emission and cold FEG sources, energy filtering, and intuitive automation, these models support everything from high-throughput EDS/EELS to atomic-resolution imaging and light-element contrast enhancement. Ideal for materials science, life sciences, semiconductor analysis, and more.

Key Features

• Cold Field Emission Guns for ultra-high brightness and low chromatic aberration (ARM200F, F200)
• Cs Correctors (ASCOR) for precise aberration correction and sub-angstrom resolution
• e-ABF and OBF STEM imaging for enhanced contrast of light and heavy elements
• Monochromators with double Wien filters for ultra-high energy resolution EELS (ARM200F Monochromated)
• Energy Filters (Omega Filter) for zero-loss imaging and elemental contrast (JEM-2200FS)
• High-Sensitivity EDS with Drift Correction using dual Silicon Drift Detectors (F200)
• Automation Suite with auto focus, montage, brightness/contrast, and stage navigation (2100Plus)
• User-Friendly Interfaces with touchscreen or Windows-compatible software (F200, 2100Plus)
• ECO Mode for reduced energy consumption during standby (F200)
• Remote Operation & Network Integration for flexible workflow environments

Application Areas

• Materials Science – Lattice-level imaging, crystal structure, and defect analysis
• Semiconductors – Failure analysis, dopant profiling, and interface characterization
• Biological Research – Cryo-TEM and low-dose imaging of sensitive biomaterials
• Nanotechnology – High-resolution imaging of nanostructures and quantum materials
• Pharmaceuticals & Polymers – Composition analysis and structural characterization
• Academic & Research Labs – Advanced instrumentation for multidisciplinary research

Compact, User-Friendly TEMs for Soft Materials & Biological Research

The 120 kV TEM series is designed for ease of use, high-quality imaging, and flexible expandability—making it the ideal entry point for laboratories working with soft materials, biological specimens, polymers, and advanced materials. Models like the JEM-120i and JEM-1400Flash offer powerful capabilities in a compact footprint, combining intuitive operation with advanced imaging technologies.

With features like high-sensitivity sCMOS cameras, fully automated controls, and wide-area montage imaging, these systems deliver high-throughput performance and reproducibility for both routine and specialized applications.

Key Features

• Compact footprint with user-friendly layout and modern design
• Simple 4-step operation for fast specimen observation
• Fully automated TEM control with no need to switch magnification modes
• Integrated “Matataki Flash” sCMOS camera for low-noise, high-speed image capture
• Limitless Panorama (LLP) system for ultra-wide area imaging with stage-driven montage
• OM–TEM overlay function for fluorescence-to-electron microscopy correlation
• LED status indicators and smart black GUI for intuitive operation
• Expandable platform with support for post-purchase add-ons and retrofits

Ideal For

• Biological & Life Sciences: Cell structures, viruses, pathological sections
• Polymers & Soft Materials: Morphology and microstructure analysis
• Nanotechnology: High-resolution imaging of nanomaterials
• Pharmaceuticals: Structural studies of drug delivery systems and macromolecules
• Academic Labs & Imaging Facilities: Teaching, training, and research applications