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JEOL is a pioneering manufacturer of Transmission Electron Microscopes (TEMs), offering a comprehensive range of instruments tailored for applications from soft materials and cryogenic samples to ultrahigh-resolution atomic imaging, materials science, and semiconductor inspection. Their lineup includes compact, user-friendly 120 kV models like the JEM‑120i and JEM‑1400Flash; versatile 200 kV systems such as the JEM‑2100Plus and F200 “F2”; and high-end 300 kV instruments like the ARM300F2 “GRAND ARM” and NEOARM—designed for advanced analytical and atomic-resolution studies. Additionally, JEOL supports cryo-EM, high-throughput semiconductor TEM, and specialized options including cameras, tomography software, and EDS accessories.
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