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Thin Film Analysis
22 Jan, 2021

Thin Film Analysis

In industries as well as applications like optical disk media, phase change materials, light-emitting diodes (LEDs), thermoelectric materials, fuel cells, flat panel displays, phase change memories, and the semiconductor industry, it is becoming more and more important to check the physical properties of thin-films. For being able to characterize the thin films according to their efficiency and suitability for a certain application, several principles of measurement are developed with time and the design of the measurement devices based on them are done.

Materials research has mainly focused on macroscopic samples, over the past century, which is often referred to as bulk samples. Initially, the primary measuring devices for solid materials were developed. But as the requirements for the characterization of nanostructures samples differs from bulk materials, another type of metrology is required to be used. For describing the properties of heat transport of a component or material, thermal diffusivity and conductivity are defined as the most important thermophysical material parameters. The Laser Flash Technique has been proven as a versatile, fast, and precise absolute method for the precise measurement of thermophysical properties. Four LFA models are offered by NETZSCH which can cover the complete spectrum of temperatures and materials. Depending on an absolute measurement method, the GHP 456 Titan has been identified as an ideal instrument to determine the thermal conductivity of insulations.

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