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  1. BCL
  2. Microscopy & Sample preparation
  3. Materialographic Testing
  4. Park System
  5. Small Sample AFM

Small Sample AFM

Small Sample Atomic Force Microscopes (AFMs), designed for samples up to 100 mm × 100 mm. Integrated with Park Systems’ advanced AFM technology, these systems deliver ultra-high-resolution, non-contact imaging with intelligent automation for hassle-free setup and scanning. Built for both academic and industrial R&D environments, they offer a robust yet user-friendly interface. Trusted in fields like materials science, semiconductor research, thin film analysis, and biomaterials, Our Small Sample AFMs ensure reliable performance and efficient workflows for cutting-edge applications in modern research labs.
 

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Small Sample AFM

Park FX40 – The Automatic AFM

Meet the future of atomic force microscopy. The Park FX40 is the first fully autonomous AFM, built for labs that value time, accuracy, and minimal manual handling. Robotic intelligence manages everything—from probe handling to image optimization—delivering faster, more reproducible results. Ideal for high-throughput labs focused on advanced nanotech research.

Park NX10 – The Premier Research Choice

Designed for cutting-edge research, the Park NX10 is known for distortion-free imaging and seamless operation. Whether you’re exploring electrical, magnetic, or mechanical properties at the nanoscale, NX10 combines precision and ease. SmartScan’s one-click imaging and fast tip exchange make this system a reliable favorite in research labs worldwide.

Park NX7 – Entry-Level Excellence

Looking to step into nanoscale research without breaking your budget? Park NX7 is your perfect start. This affordable, research-grade AFM offers powerful scanning capabilities, intuitive controls, and uncompromised quality. Ideal for academic labs and first-time AFM users seeking reliable performance and room to grow.

Benefits

Designed to empower researchers, these systems offer real-world advantages that boost productivity, enhance reliability, and simplify every stage of your workflow.

  • Accelerates research workflows with one-click imaging
  • Reduces human error through automation and safety interlocks
  • Ensures data reproducibility for reliable publications
  • Scales with lab needs—from entry-level to advanced research
  • Simplifies training and operation for multi-user environments
  • Saves time with real-time system diagnostics and alerts
  • Minimizes maintenance through robust hardware design
  • Maximizes ROI with adaptable configurations and accessories
  • Seamlessly integrates into academic and industrial setups

Features

Engineered with cutting-edge innovation, our Small Sample AFMs are packed with features that deliver unmatched precision and control for nanoscale applications.

  • Ultra-low noise Z detectors for high-resolution imaging
  • Robust closed-loop XY scanning for distortion-free scans
  • Wide range of AFM modes for diverse research applications
  • SmartScan software for intuitive, automated operation
  • Integrated robotics (FX40) for complete automation
  • Probe protection with advanced tip landing algorithms
  • Real-time environmental monitoring (FX40)
  • Easy tip exchange system across models
  • Compact footprint, ideal for small sample handling
  • Compatibility with thermal, chemical, and electrical measurement options

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