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Scanning Electron Microscope
29 Jan, 2021

Scanning Electron Microscope

The advanced analytical tool of Scanning Electron Microscope (SEM) can heavily go beyond the capabilities of a conventional light microscope. In a compound microscope, the basic array of magnifying lenses allows for sample magnification by around 1000x with the use of visible wavelengths of light in the range of 400 – 700 nanometer (nm). This helps the analysts to take care of the points in a specimen that are not closer to each other by 200nm. In closer proximity, the topographical features than this lower detection range cannot be differentiated with any degree of reliability.

The wavelength range of traditional microscopy was limited as the requirements for elemental topography measurements and nanoscale material characterization became hugely common all over the world. As a result, scanning electron microscopes were developed for offering traditional ways of sample imaging with the help of electron scanning.

COXEM is specialized in manufacturing advanced analytical testing instruments that can be applied for a wide range of industries ranging from forensic samples to consumer products. BCL proudly supplies their exceptional range of Scanning Electron Microscopes in the Middle East. You can use them for all your projects of comprehensive testing of products and goods.