Park nano-IR Spectroscopy

A Practical Solution for High-Resolution Material Characterization

The Park nano-IR system combines nanoscale infrared (IR) spectroscopy with atomic force microscopy (AFM), enabling precise chemical imaging at resolutions beyond conventional methods. With its integration of photo-induced force microscopy (PiFM) technology, the system supports accurate molecular analysis at the nanoscale—down to approximately 10 nm spatial resolution.

Designed to meet the needs of multi-user research facilities, industrial labs, and academic institutions, the system is optimized for ease of use and consistent performance. It is well suited for applications involving sensitive materials and supports a variety of use cases, including chemical mapping, polymer studies, and semiconductor analysis.

Why Choose This System?
Here’s what makes Park nano-IR a smart addition to your lab product line:

• Easy integration for users already familiar with AFM
• Perfect for labs needing multi-functional analysis in one tool
• Ideal for failure analysis, polymer research, and 2D material studies
• Saves you time with automated alignment and measurement setup
• Backed by reliable performance and after-sale support
• Flexible sizing for sample formats—from small pieces to 300 mm wafers
• Advanced software with intuitive controls—no extra training needed