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Accurate, repeatable and easily configurable solutions

DC and RF modeling of semiconductor devices needs users to collect a significant amount of measured data from several wafers over a wide range of temperatures. BCL brings to you an advanced range of DC and RF Characterization devices and software for easing out the entire process for you.

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DC / RF Characterization
Testing & Characterization
DC / RF Characterization

It is needed for collecting a significant amount of measured data from the several wafers over various temperatures by the devices for DC/CV and RF modeling. A conventional type of DC/CV measurement test cell comprises of a semi-automated prober having thermal chuck along with a DC analyzer along with a sw...